Microstructure, leakage current and dielectric tunability of Na0.5Bi0.5(Ti0.99Zn0.01)O3 thin films: An annealing atmosphere-dependent study

Autor: Geng, F.J., Yang, C.H., Lv, P.P., Wei, C., Qian, J., Feng, C., Yao, Q., Jiang, X.M., Song, P.
Zdroj: In Ceramics International 15 May 2016 42(7):8744-8749
Databáze: ScienceDirect