Reduced warpage in semiconductor packages: Optimizing post-cure temperature profile considering cure shrinkage and viscoelasticity of epoxy molding compound

Autor: Um, Hui-Jin, Ju, Young-Min, Lee, Dae-Woong, Ahn, Jinho, Kim, Hak-Sung
Zdroj: In Materials & Design September 2024 245
Databáze: ScienceDirect