Review of Scanners for DC to 20 kHz electrical metrology applications

Autor: Pacheco-Estrada, A.H., Hernandez-Marquez, F.L., Rodríguez-Reséndiz, J., Duarte-Galvan, C., Contreras-Medina, L.M.
Zdroj: In Measurement January 2022 187
Databáze: ScienceDirect