Defectivity of Al:ZnO thin films with different crystalline order probed by Positron Annihilation Spectroscopy

Autor: Magrin Maffei, R., Butterling, M., Liedke, M.O., D’Addato, S., di Bona, A., Bertoni, G., Gazzadi, G.C., Mariazzi, S., Wagner, A., Brusa, R.S., Benedetti, S.
Zdroj: In Applied Surface Science 30 August 2024 665
Databáze: ScienceDirect