Chemical degradation of selected Zn-based corrosion products induced by C60 cluster, Ar cluster and Ar+ ion sputtering in the focus of X-ray photoelectron spectroscopy (XPS)
| Autor: | Steinberger, R., Sicking, J., Weise, J., Duchoslav, J., Greunz, T., Meyer, D.C., Stifter, D. |
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| Zdroj: | In Applied Surface Science 1 May 2017 403:15-22 |
| Databáze: | ScienceDirect |
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