Simulation of real I-V characteristics of metal/GaN/AlGaN heterostructure based on the 12-EXT model of trap-assisted tunnelling

Autor: Racko, Juraj, Benko, Peter, Mikolášek, Miroslav, Granzner, Ralf, Kittler, Mario, Schwierz, Frank, Harmatha, Ladislav, Breza, Juraj
Zdroj: In Applied Surface Science 15 February 2017 395:122-130
Databáze: ScienceDirect