Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures
Autor: | Hosea, T.J.C., Cripps, S.A., Sale, T.E., Hild, K. |
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Zdroj: | In Applied Surface Science 2006 253(1):70-79 |
Databáze: | ScienceDirect |
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