SIMS as a new methodology to depth profile helium in as-implanted and annealed pure bcc metals?
| Autor: | Gorondy-Novak, S., Jomard, F., Prima, F., Lefaix-Jeuland, H. |
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| Zdroj: | In Nuclear Inst. and Methods in Physics Research, B 1 May 2017 398:56-64 |
| Databáze: | ScienceDirect |
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