Difference of soft error rates in SOI SRAM induced by various high energy ion species

Autor: Abo, Satoshi, Masuda, Naoyuki, Wakaya, Fujio, Lohner, Tivadar, Onoda, Shinobu, Makino, Takahiro, Hirao, Toshio, Ohshima, Takeshi, Iwamatsu, Toshiaki, Oda, Hidekazu, Takai, Mikio
Zdroj: In Nuclear Inst. and Methods in Physics Research, B 2012 273:262-265
Databáze: ScienceDirect