X-ray production yield in standardized thick target PIXE

Autor: Aburaya, Jim Heiji, Added, Nemitala, Tabacniks, Manfredo Harri, de Almeida Rizzutto, Márcia, Barbosa, Marcel Dupret Lopes
Zdroj: In Nuclear Inst. and Methods in Physics Research, B August 2006 249(1-2):792-795
Databáze: ScienceDirect