Origin of charges in bulk Si:HfO2 FeFET probed by nanosecond polarization measurements
| Autor: | Dahan, Mor Mordechai, Mulaosmanovic, Halid, Levit, Or, Dünkel, Stefan, Müller, Johannes, Beyer, Sven, Yalon, Eilam |
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| Zdroj: | In Microelectronic Engineering 11 January 2025 296 |
| Databáze: | ScienceDirect |
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