Quantification of shear induced agglomeration in chemical mechanical polishing slurries under different chemical environments
Autor: | Khanna, Aniruddh J., Gupta, Sushant, Kumar, Purushottam, Chang, Feng-Chi, Singh, Rajiv K. |
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Zdroj: | In Microelectronic Engineering 1 April 2019 210:1-7 |
Databáze: | ScienceDirect |
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