Amorphous silicon carbide nitride layer as an alternative to a disordered silicon surface to suppress RF/microwave losses
Autor: | Evseev, S.B., Nanver, L.K., Rejaei, B., Milosavljević, S. |
---|---|
Zdroj: | In Microelectronic Engineering 1 August 2014 125:2-7 |
Databáze: | ScienceDirect |
Externí odkaz: |