Measurement and simulation of the pull-off strength at the separation of miniaturized 3D connectors consisting of silicon masters with undercuts and PDMS replicas

Autor: Zajadacz, J., Lorenz, P., Ehrhardt, M., Zimmer, K., Möllenbeck, S., Dhima, K., Scheer, H.-C.
Zdroj: In Microelectronic Engineering January 2013 101:31-36
Databáze: ScienceDirect