Environment-proof writing chamber for next generation electron beam mask writing system

Autor: Ogasawara, M. , Akeno, K., Hayashi, R., Yanaga, S., Kobayashi, N., Nishimura, S., Mitsui, S., Shimizu, M., Kusakabe, H., Tojo, T., Yasuda, S.
Zdroj: In Microelectronic Engineering 2002 61:337-342
Databáze: ScienceDirect