Room-temperature and low-pressure nanoimprint lithography

Autor: Lebib, A., Chen, Y. , Cambril, E., Youinou, P., Studer, V., Natali, M., Pépin, A., Janssen, H.M., Sijbesma, R.P.
Zdroj: In Microelectronic Engineering 2002 61:371-377
Databáze: ScienceDirect