Attacking NIST biometric image software using nonlinear optimization
| Autor: | Raj, Sunny, Pannu, Jodh S., Fernandes, Steven L., Ramanathan, Arvind, Pullum, Laura L., Jha, Sumit K. |
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| Zdroj: | In Pattern Recognition Letters March 2020 131:79-84 |
| Databáze: | ScienceDirect |
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