Structural, electrical and thermoelectrical properties of (Bi 1 − xSb x) 2Te 3 thin films grown by MOCVD process

Autor: Aboulfarah, B., Giani, A., Boyer, A., Mzerd, A.
Zdroj: In Annales de chimie - Sciences des materiaux 2000 25(4):263-267
Databáze: ScienceDirect