Optimization of deconvoluted parameter for the quantification of high-resolution SIMS depth profiles
| Autor: | Li, T.T., Zhuang, X.M., Li, H.M., Xu, Y.X., Ma, Z.Q., Zheng, J.Q., Geng, Y.Q., Wang, C.L., Lian, S.Y., Wang, J.Y., Xu, C.K. |
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| Zdroj: | In Vacuum September 2023 215 |
| Databáze: | ScienceDirect |
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