Thickness regulation of the mechanical properties and failure control of Ti/TiN and Ti(N)/TiN bilayer stacks

Autor: Si, Biao, Ren, Yi, Wang, Ding, Sun, Linfan, Zhou, Yanwen, Zhang, Kaice, Su, Zhiwei, Zhao, Zhuo
Zdroj: In Thin Solid Films 30 January 2024 789
Databáze: ScienceDirect