Reducing the nano-scale defect formation of atomic-layer-deposited SrTiO3 films by adjusting the cooling rate of the crystallization annealing of the seed layer

Autor: Lee, Woongkyu, Yoo, Sijung, Jeon, Woojin, Yoo, Yeon Woo, An, Cheol Hyun, Chung, Min Jung, Kim, Han Joon, Lee, Sang Woon, Hwang, Cheol Seong
Zdroj: In Thin Solid Films 31 August 2015 589:723-729
Databáze: ScienceDirect