Flash-lamp annealing of ZnO-layers on copper–indium–gallium–sulphide layers: A spectroscopic ellipsometry study
Autor: | Reck, J., Seeger, S., Weise, M., Mientus, R., Schulte, J., Ellmer, K. |
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Zdroj: | In Thin Solid Films 28 November 2014 571 Part 3:762-766 |
Databáze: | ScienceDirect |
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