Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy
| Autor: | Solina, D.M, Cheary, R.W *, Swift, P.D, Dligatch, S, McCredie, G.M, Gong, B, Lynch, P |
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| Zdroj: | In Thin Solid Films 2000 372(1):94-103 |
| Databáze: | ScienceDirect |
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