Numerical modeling of reverse recovery characteristic in silicon pin diodes
Autor: | Yamashita, Yusuke, Tadano, Hiroshi |
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Zdroj: | In Solid State Electronics July 2018 145:8-18 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Yamashita, Yusuke, Tadano, Hiroshi |
---|---|
Zdroj: | In Solid State Electronics July 2018 145:8-18 |
Databáze: | ScienceDirect |
Externí odkaz: |