Channel scaling and field-effect mobility extraction in amorphous InZnO thin film transistors
Autor: | Lee, Sunghwan, Song, Yang, Park, Hongsik, Zaslavsky, A., Paine, D.C. |
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Zdroj: | In Solid State Electronics September 2017 135:94-99 |
Databáze: | ScienceDirect |
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