Influence of sputtering pressure on morphological, mechanical and electrical properties of Al-doped ZnO films

Autor: Kar, J.P., Kim, S., Shin, B., Park, K.I., Ahn, K.J., Lee, W., Cho, J.H., Myoung, J.M.
Zdroj: In Solid State Electronics 2010 54(11):1447-1450
Databáze: ScienceDirect