Fin shape fluctuations in FinFET: Correlation to electrical variability and impact on 6-T SRAM noise margins
| Autor: | Baravelli, Emanuele, De Marchi, Luca, Speciale, Nicolò |
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| Zdroj: | In Solid State Electronics 2009 53(12):1303-1312 |
| Databáze: | ScienceDirect |
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