Substrate current and degradation of trench LDD transistors
| Autor: | Landgraf, E., Hofmann, F., Schulz, T., von Philipsborn, H. |
|---|---|
| Zdroj: | In Solid State Electronics 2002 46(7):965-970 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
| Autor: | Landgraf, E., Hofmann, F., Schulz, T., von Philipsborn, H. |
|---|---|
| Zdroj: | In Solid State Electronics 2002 46(7):965-970 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect