Physical thickness and group refractive index measurement of individual layers for double-stacked microstructures using spectral-domain interferometry
| Autor: | Park, Jungjae, Bae, Jaeseok, Kim, Jong-Ahn, Jin, Jonghan |
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| Zdroj: | In Optics Communications 15 January 2019 431:181-186 |
| Databáze: | ScienceDirect |
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