A novel in-situ approach to monitor the variations in the on-resistance of power transistors during switching operation
| Autor: | Cavaliere, A., De Santi, C., Meneghesso, G., Zanoni, E., Meneghini, M. |
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| Zdroj: | In Microelectronics Reliability November 2023 150 |
| Databáze: | ScienceDirect |
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