Towards electro-thermo-mechanical lifetime assessment for arbitrary power electronics

Autor:	Gschwandl, Mario, Friedrich, Birgit, Pfost, Martin, Antretter, Thomas, Fuchs, Peter Filipp, Mitev, Ivaylo, Tao, Qi, Schingale, Angelika
Zdroj:	In Microelectronics Reliability June 2022 133
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect