An improved accelerated degradation model for LED reliability assessment with self-heating impacts
| Autor: | Truong, Minh-Tuan, Do, Phuc, Mendizabal, Laurent, Iung, Benoit |
|---|---|
| Zdroj: | In Microelectronics Reliability January 2022 128 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect