A lifetime assessment and prediction method for large area solder joints
Autor: | Lederer, M., Kotas, A. Betzwar, Khatibi, G. |
---|---|
Zdroj: | In Microelectronics Reliability November 2020 114 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Lederer, M., Kotas, A. Betzwar, Khatibi, G. |
---|---|
Zdroj: | In Microelectronics Reliability November 2020 114 |
Databáze: | ScienceDirect |
Externí odkaz: |