Electrical duality design for the radon-222 decay chain
Autor: | Ahmadi, Mohammad, Soltani-Nabipour, Jamshid, Khorshidi, Abdollah, Negarestani, Ali, Taheri, Fariba |
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Zdroj: | In Microelectronics Reliability April 2020 107 |
Databáze: | ScienceDirect |
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