High Voltage Temperature Humidity Bias Test (THB) customized system and methodologies for reliability assessment of power semiconductor devices
| Autor: | Cimmino, D., Busca, R., Ferrero, S., Pirri, F., Richieri, G., Carta, R. |
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| Zdroj: | In Microelectronics Reliability September 2019 100-101 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect