Development of fast short-circuit protection system for advanced IGBT

Autor:	Ichiki, M., Arimoto, T., Abe, S., Tsukuda, M., Omura, I.
Zdroj:	In Microelectronics Reliability September 2019 100-101
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect