TCAD investigation on hot-electron injection in new-generation technologies
Autor: | Reggiani, S., Rossetti, M., Gnudi, A., Tallarico, A.N., Molfese, A., Manzini, S., Depetro, R., Croce, G., Sangiorgi, E., Fiegna, C. |
---|---|
Zdroj: | In Microelectronics Reliability September 2018 88-90:1090-1093 |
Databáze: | ScienceDirect |
Externí odkaz: |