TCAD investigation on hot-electron injection in new-generation technologies

Autor: Reggiani, S., Rossetti, M., Gnudi, A., Tallarico, A.N., Molfese, A., Manzini, S., Depetro, R., Croce, G., Sangiorgi, E., Fiegna, C.
Zdroj: In Microelectronics Reliability September 2018 88-90:1090-1093
Databáze: ScienceDirect