Creep measurement and choice of creep laws for BGA assemblies' reliability simulation
| Autor: | Pin, S., Guédon-Gracia, A., Delétage, J.-Y., Frémont, H. |
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| Zdroj: | In Microelectronics Reliability September 2018 88-90:1172-1176 |
| Databáze: | ScienceDirect |
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