Long-term degradation of InGaN-based laser diodes: Role of defects
| Autor: | Monti, D., Meneghini, M., De Santi, C., Meneghesso, G., Zanoni, E., Bojarska, A., Perlin, P. |
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| Zdroj: | In Microelectronics Reliability September 2017 76-77:584-587 |
| Databáze: | ScienceDirect |
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