Experimental investigation of discrete air cooled device thermal resistance dependence on cooling conditions

Autor: Janicki, Marcin, Torzewicz, Tomasz, Samson, Agnieszka, Raszkowski, Tomasz, Sobczak, Artur, Zubert, Mariusz, Napieralski, Andrzej
Zdroj: In Microelectronics Reliability December 2017 79:405-409
Databáze: ScienceDirect