Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization
| Autor: | Courjault, N., Perdu, P., Infante, F., Lebey, T., Bley, V. |
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| Zdroj: | In Microelectronics Reliability August-September 2015 55(9-10):1622-1627 |
| Databáze: | ScienceDirect |
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