Trench MOS barrier Schottky rectifier formed by counter-doping trench-bottom implantation

Autor: Juang, Miin-Horng a, ⁎, Yu, Jim a, Hwang, C.C. b, Shye, D.C. b, Wang, J.L. b
Zdroj: In Microelectronics Reliability 2011 51(2):365-369
Databáze: ScienceDirect