Creep lifetime prediction of solder joint for heat sink assembly
Autor: | Han, Changwoon ⁎, Oh, Chulmin, Park, Nochang, Hong, Wonsik |
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Zdroj: | In Microelectronics Reliability 2010 50(9):1645-1649 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Han, Changwoon ⁎, Oh, Chulmin, Park, Nochang, Hong, Wonsik |
---|---|
Zdroj: | In Microelectronics Reliability 2010 50(9):1645-1649 |
Databáze: | ScienceDirect |
Externí odkaz: |