Threshold voltage instability in high-k based flash memories
Autor: | Rao, Rosario, Irrera, Fernanda |
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Zdroj: | In Microelectronics Reliability 2010 50(9):1273-1277 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Rao, Rosario, Irrera, Fernanda |
---|---|
Zdroj: | In Microelectronics Reliability 2010 50(9):1273-1277 |
Databáze: | ScienceDirect |
Externí odkaz: |