Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges
| Autor: | Djeffal, F., Ghoggali, Z., Dibi, Z., Lakhdar, N. |
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| Zdroj: | In Microelectronics Reliability 2009 49(4):377-381 |
| Databáze: | ScienceDirect |
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