RF CMOS reliability simulations
| Autor: | Sasse, Guido T., Acar, Mustafa, Kuper, Fred G., Schmitz, Jurriaan |
|---|---|
| Zdroj: | In Microelectronics Reliability 2008 48(8):1581-1585 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Sasse, Guido T., Acar, Mustafa, Kuper, Fred G., Schmitz, Jurriaan |
|---|---|
| Zdroj: | In Microelectronics Reliability 2008 48(8):1581-1585 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect