Numerical modeling of warpage induced in QFN array molding process

Autor: Yang, D.G., Jansen, K.M.B., Ernst, L.J., Zhang, G.Q., van Driel, W.D., Bressers, H.J.L., Janssen, J.H.J.
Zdroj: In Microelectronics Reliability 2007 47(2):310-318
Databáze: ScienceDirect