FTIR spectroscopy for the hermeticity assessment of micro-cavities
Autor: | Veyrié, D., Lellouchi, D., Roux, J.L., Pressecq, F., Tetelin, A., Pellet, C. |
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Zdroj: | In Microelectronics Reliability 2005 45(9):1764-1769 |
Databáze: | ScienceDirect |
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