FTIR spectroscopy for the hermeticity assessment of micro-cavities

Autor: Veyrié, D., Lellouchi, D., Roux, J.L., Pressecq, F., Tetelin, A., Pellet, C.
Zdroj: In Microelectronics Reliability 2005 45(9):1764-1769
Databáze: ScienceDirect