Electrothermal characterization of silicon-on-glass VDMOSFETs
| Autor: | Nenadović, N., Cuoco, V., Theeuwen, S.J.C.H., Nanver, L.K., Schellevis, H., Spierings, G., Jos, H.F.F., Slotboom, J.W. |
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| Zdroj: | In Microelectronics Reliability 2005 45(3):541-550 |
| Databáze: | ScienceDirect |
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