Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes
| Autor: | Tao, Guoqiao, Scarpa, Andrea, van Marwijk, Leo, van Dijk, Kitty, Kuper, Fred |
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| Zdroj: | In Microelectronics Reliability 2004 44(8):1269-1273 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect